Paper
20 August 2009 Failure analysis methods applied to PV module reliability
William J. Gambogi, Elizabeth F. McCord, H. David Rosenfeld, Roger H. Senigo, Scott Peacock, Katherine M. Stika
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Abstract
In the testing of photovoltaic materials and modules, failure analysis provides insights into the specific mechanism of performance breakdown and offers opportunities to improve performance by materials or process modification. We review various analytical methods applied to photovoltaic modules and test structures to better understand the nature of failure, including several methods not previously discussed in failure analysis literature as applied to photovoltaic devices. Included in this discussion will be the use of environmental scanning electron microscopy (ESEM) and x-ray microtomography to investigate the failure mechanism in electrical impulse testing of a candidate PV module.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
William J. Gambogi, Elizabeth F. McCord, H. David Rosenfeld, Roger H. Senigo, Scott Peacock, and Katherine M. Stika "Failure analysis methods applied to PV module reliability", Proc. SPIE 7412, Reliability of Photovoltaic Cells, Modules, Components, and Systems II, 74120P (20 August 2009); https://doi.org/10.1117/12.826956
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CITATIONS
Cited by 5 scholarly publications.
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KEYWORDS
Failure analysis

Solar cells

X-rays

Copper

Crystals

Glasses

Reliability

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