Paper
21 September 2009 A quantum-limited CMOS-sensor-based high-speed imaging system for time-resolved x-ray scattering
Brian Rodricks, Boyd Fowler, Chiao Liu, John Lowes, Lucas J. Koerner, Mark W. Tate, Sol M. Gruner
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Abstract
The field of ultrafast x-ray science is flourishing, driven by emerging synchrotron sources (e.g., time-slice storage rings, energy recovery linacs, free electron lasers) capable of fine time resolution. New hybrid x-ray detectors are under development in order to exploit these new capabilities. This paper describes the development of a 2160 x 2560 CMOS image sensor (CIS) system with a 6.5 µm pitch optimized for time-resolved x-ray scattering studies. The system is single photon quantum limited from 8 keV to 20 keV. It has a wide dynamic range and can operate at 100 Hz full-frame and at higher frequencies using a region-of-interest (ROI) readout. Fundamental metrics of linearity, dynamic range, spatial resolution, conversion gain, sensitivity and Detective Quantum Efficiency are estimated. Experimental time-resolved data are also presented.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Brian Rodricks, Boyd Fowler, Chiao Liu, John Lowes, Lucas J. Koerner, Mark W. Tate, and Sol M. Gruner "A quantum-limited CMOS-sensor-based high-speed imaging system for time-resolved x-ray scattering", Proc. SPIE 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI, 74490Y (21 September 2009); https://doi.org/10.1117/12.828329
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Cited by 1 scholarly publication.
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KEYWORDS
X-rays

Scattering

X-ray imaging

High speed imaging

Imaging systems

CMOS sensors

Free electron lasers

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