Characterization of vapor-deposited Lu[sub]2[/sub]O[sub]3[/sub]:Eu[sup]3+[/sup] scintillator for x-ray imaging applications

Vivek V. Nagarkar; S. G. Topping; S. R. Miller; B. Singh; C. Brecher; V. K. Sarin

doi:10.1117/12.831031

11 September 2009 Characterization of vapor-deposited Lu₂O₃:Eu³⁺ scintillator for x-ray imaging applications

Vivek V. Nagarkar, S. G. Topping, S. R. Miller, B. Singh, C. Brecher, V. K. Sarin

Proceedings Volume 7450, Penetrating Radiation Systems and Applications X; 745003 (2009) https://doi.org/10.1117/12.831031
Event: SPIE Optical Engineering + Applications, 2009, San Diego, California, United States

Abstract

The europium-doped lutetium oxide (Lu₂O₃:Eu) transparent optical ceramic has excellent scintillation properties, namely very high density (9.5 g/cm³), high effective atomic number (67.3), light output comparable to thallium-doped cesium iodide (CsI:Tl), and emission wavelength (610 nm) for which silicon-based detectors have a very high quantum efficiency. If microcolumnar films of this material could be fabricated, it would find widespread use in a multitude of highspeed imaging applications. However, the high melting point of over 2400°C makes it extremely challenging to make microcolumnar films of this material. We have recently fabricated and characterized microcolumnar films of Lu₂O₃:Eu. These results are presented in this paper.

Citation Download Citation

Vivek V. Nagarkar, S. G. Topping, S. R. Miller, B. Singh, C. Brecher, and V. K. Sarin "Characterization of vapor-deposited Lu₂O₃:Eu³⁺ scintillator for x-ray imaging applications", Proc. SPIE 7450, Penetrating Radiation Systems and Applications X, 745003 (11 September 2009); https://doi.org/10.1117/12.831031

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