Excitation mechanism of the B+ emission line at 345.1 nm in low-temperature plasmas

V. P. Kudrya

doi:10.1117/12.853289

26 February 2010 Excitation mechanism of the B⁺ emission line at 345.1 nm in low-temperature plasmas

V. P. Kudrya

Proceedings Volume 7521, International Conference on Micro- and Nano-Electronics 2009; 752109 (2010) https://doi.org/10.1117/12.853289
Event: International Conference on Micro- and Nano-Electronics 2009, 2009, Zvenigorod, Russian Federation

Abstract

The results of a 345.1 nm line excitation mechanism investigation are presented. A comprehensive analysis of the radiative transition rates for the B⁺ lower energy levels is carried out. The rate constants of the electron impact excitation/de-excitation processes involved are also calculated. These fundamental data are used in a collisional-radiative model that results in the steady-state B⁺ level population. An important feature of the model is taking into account a ladder excitation mechanism through the metastable level 2s2p³P^o by electron impact. This mechanism strongly changes the dependences of the level populations (and line intensities) on the plasma electron temperature. A dependence of the intensity ratio at 345.1 nm and 162.4 nm on the plasma electron temperature is also presented which can be used for plasma diagnostics.

Citation Download Citation

V. P. Kudrya "Excitation mechanism of the B⁺ emission line at 345.1 nm in low-temperature plasmas", Proc. SPIE 7521, International Conference on Micro- and Nano-Electronics 2009, 752109 (26 February 2010); https://doi.org/10.1117/12.853289

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