New developments in STED microscopy

Arnold Giske; Jochen Sieber; Hilmar Gugel; Marcus Dyba; Volker Seyfried; Dietmar Gnass

doi:10.1117/12.843156

17 February 2010 New developments in STED microscopy

Arnold Giske, Jochen Sieber, Hilmar Gugel, Marcus Dyba, Volker Seyfried, Dietmar Gnass

Proceedings Volume 7578, Solid State Lasers XIX: Technology and Devices; 75781X (2010) https://doi.org/10.1117/12.843156
Event: SPIE LASE, 2010, San Francisco, California, United States

Abstract

STED microscopy has gained recognition as a method to break the diffraction limit of conventional light microscopy. Despite being a new technique, STED is already successfully implemented in life science research. The resolution enhancement is achieved by depleting fluorescent markers via stimulated emission. The performance is significantly dependent on the laser source and the fluorescence markers. Therefore the use of novel fluorescent markers in conjunction with the right laser system was the main focus of our research. We present new developments and applications of STED microscopy, unraveling structural details on scales below 90nm and give an overview of required specifications for the solid state laser systems.

Citation Download Citation

Arnold Giske, Jochen Sieber, Hilmar Gugel, Marcus Dyba, Volker Seyfried, and Dietmar Gnass "New developments in STED microscopy", Proc. SPIE 7578, Solid State Lasers XIX: Technology and Devices, 75781X (17 February 2010); https://doi.org/10.1117/12.843156

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