Paper
25 February 2010 Study on temperature characteristic of green photodetector on Si substrate
Xiansong Fu, Suying Yao, Shengcai Zhang, Yunguang Zheng, Pingjuan Niu, Xiaoyun Li, Guanghua Yang
Author Affiliations +
Abstract
In the paper, a silicon PN junction photodetector is developed on the basis of n-type single-crystal (100) silicon substrate. The properties of this semiconductor photodetctor depend on the temperature to certain extent. We emphasize on the study on temperature characteristic of the photodetector: Firstly, the temperature behavior of dark current at zero bias voltage and wide temperature range was investigated. Results show that dark current increases exponentially with temperature over room temperature. Secondly, the temperature behavior of photo current at zero bias voltage and wide temperature range was studied. The temperature characteristic is analysesed in the theory and optimized.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xiansong Fu, Suying Yao, Shengcai Zhang, Yunguang Zheng, Pingjuan Niu, Xiaoyun Li, and Guanghua Yang "Study on temperature characteristic of green photodetector on Si substrate", Proc. SPIE 7597, Physics and Simulation of Optoelectronic Devices XVIII, 759722 (25 February 2010); https://doi.org/10.1117/12.841621
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photodetectors

Silicon

Temperature metrology

Signal to noise ratio

Remote sensing

Resistance

Semiconductors

RELATED CONTENT

High-sensitivity photon-counting imaging detector
Proceedings of SPIE (January 20 2005)
Noise in solid state sensors
Proceedings of SPIE (May 25 2004)
Silicon Photodetectors Restated
Proceedings of SPIE (February 19 1982)

Back to Top