Novel method to examine phase object by the use of TFT-LCD

Rongli Guo; Baoli Yao; Jun Han; Xun Yu; Liang Nie; Cunli Duan; Fan Wang

doi:10.1117/12.866452

11 October 2010 Novel method to examine phase object by the use of TFT-LCD

Rongli Guo, Baoli Yao, Jun Han, Xun Yu, Liang Nie, Cunli Duan, Fan Wang

Proceedings Volume 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment; 76563D (2010) https://doi.org/10.1117/12.866452
Event: 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 2010, Dalian, China

Abstract

A novel method of using Thin Film Transistor-Liquid Crystal Display(TFT-LCD) as phase filter in Zernike phase contrast method is introduced. First, theoretical analysis of using TFT-LCD as programmable phase modulator instead of conventional phase contrast plate to filter the spectrum is conducted. Then the phase modulation property curve of the used TFT-LCD is measured which is function of gray scales in modified Mach-Zehnder interferometer, and frequency filtering is used to eliminate interferogram's noise and the correlation method is adopted to determine the mini-displacement of interference fringe. At last, Experiment conducted in 4F system. The result showed that the method is effective in qualitative observation of phase distribution for a small phase object.

Citation Download Citation

Rongli Guo, Baoli Yao, Jun Han, Xun Yu, Liang Nie, Cunli Duan, and Fan Wang "Novel method to examine phase object by the use of TFT-LCD", Proc. SPIE 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment, 76563D (11 October 2010); https://doi.org/10.1117/12.866452

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KEYWORDS

Phase shift keying

LCDs

Modulation

Phase modulation

Optical filters

Phase measurement

Phase contrast

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