Practical applications of Zernike phase surfaces in optical system modeling

Steven H. Vogel

doi:10.1117/12.853089

3 May 2010 Practical applications of Zernike phase surfaces in optical system modeling

Steven H. Vogel

Proceedings Volume 7660, Infrared Technology and Applications XXXVI; 76602B (2010) https://doi.org/10.1117/12.853089
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

There are times when it would be helpful to share performance information about an optical system without disclosing proprietary information between multiple parties. A combination of Zernike phase surfaces and paraxial surfaces can be used to model an optical system and provide a method to safely transfer the required information without disclosing the specifics of the design such as details about the optical materials or the specific element geometry. This paper deals with some of the practical aspects of this approach such as aperture stop location, the affects of windows which may change thickness on the construction of the model, and the need for multiple field positions and wavelengths.

Citation Download Citation

Steven H. Vogel "Practical applications of Zernike phase surfaces in optical system modeling", Proc. SPIE 7660, Infrared Technology and Applications XXXVI, 76602B (3 May 2010); https://doi.org/10.1117/12.853089

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available