Polarized point diffraction interferometer for fringe stabilization

Hagyong Kihm; Yun-Woo Lee

doi:10.1117/12.859805

2 August 2010 Polarized point diffraction interferometer for fringe stabilization

Hagyong Kihm, Yun-Woo Lee

Proceedings Volume 7790, Interferometry XV: Techniques and Analysis; 779013 (2010) https://doi.org/10.1117/12.859805
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

We propose a new point diffraction interferometer using a polarizer with a pinholed for qualitative optical analysis. Diffraction from a polarizer with a pinholed makes reference and measurement waves. Interference fringe between diffracted-undiffracted measurement wave and undiffracted-diffracted reference wave is stabilized by common-path configuration. We examined the pinhole size and divergence angle of the diffracted wave for test optics with various numerical aperture. Optical parts comprising the interferometer can be assembled into a small monolithic component and embedded into an imaging target for easy alignment. Optical systems evaluating imaging performances such as modulation transfer function would benefit in aligning target objects.

Citation Download Citation

Hagyong Kihm and Yun-Woo Lee "Polarized point diffraction interferometer for fringe stabilization", Proc. SPIE 7790, Interferometry XV: Techniques and Analysis, 779013 (2 August 2010); https://doi.org/10.1117/12.859805

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