Paper
29 September 2010 DLC/Si multilayer mirrors for EUV radiation
Peter Gawlitza, Stefan Braun, Andreas Leson, Wouter Soer, Martin Jak, Vadim Banine
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Abstract
In this paper, a new type of spectral filter mirrors for extreme ultraviolet radiation based on DLC/Si multilayer coatings is presented (DLC - diamond-like carbon). The coating is nearly transparent for infrared radiation (IR) of λ = 10.6 nm but highly reflective at λ = 13.5 nm (EUV). We deposited DLC/Si multilayers by ion beam sputter deposition with 40 and 60 periods exhibiting maximum EUV reflectances of about Rmax = 43 % and Rmax = 50 %, respectively. Combining IR antireflective and EUV reflective coatings, first prototype mirrors have been fabricated with an EUV reflectance of about 42.5 % and an IR reflectance of about 4.4 % at the same time. Investigations on the thermal behavior of the multilayer stack and the cleaning properties for tin contaminated mirror surfaces have been carried out. Excellent stabilities of EUV peak position and reflectance values have been found using annealing temperatures of up to 700 °C. Furthermore, several cycles of Sn etching under H2 reactive conditions have been applied to the mirrors without significant changes of the filter performance.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter Gawlitza, Stefan Braun, Andreas Leson, Wouter Soer, Martin Jak, and Vadim Banine "DLC/Si multilayer mirrors for EUV radiation", Proc. SPIE 7802, Advances in X-Ray/EUV Optics and Components V, 78020A (29 September 2010); https://doi.org/10.1117/12.861165
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Cited by 1 scholarly publication and 2 patents.
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KEYWORDS
Extreme ultraviolet

Multilayers

Mirrors

Reflectivity

Silicon

Antireflective coatings

Ions

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