Key components for artifact-free micro-CT and nano-CT instruments

Alexander Sasov; Bart Pauwels; Xuan Liu; Peter Bruyndonckx

doi:10.1117/12.860380

2 September 2010 Key components for artifact-free micro-CT and nano-CT instruments

Alexander Sasov, Bart Pauwels, Xuan Liu, Peter Bruyndonckx

Proceedings Volume 7804, Developments in X-Ray Tomography VII; 78040U (2010) https://doi.org/10.1117/12.860380
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

Proper selection of modern key components allows eliminating most artifacts in micro-CT and nano-CT systems already during data acquisition. X-ray cameras with direct photon detection allow avoiding ring artifacts. Newly developed fully depleted CCD sensors show an energy response similar to traditional cameras with a thin scintillator, but without any geometrical distortions and flashes from x-ray photons penetrating through the fiber optics. Air-bearing rotation stages and piezo-positioning minimizes mechanical inaccuracies in acquiring angular projections. Beam hardening can be eliminated by energy-selective photon counting imaging.

Citation Download Citation

Alexander Sasov, Bart Pauwels, Xuan Liu, and Peter Bruyndonckx "Key components for artifact-free micro-CT and nano-CT instruments", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 78040U (2 September 2010); https://doi.org/10.1117/12.860380

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available