Line and streak detection on polished and textured surfaces using line integrals

M. Sezer Erkilinc; Mustafa Jaber; Eli Saber; Robert Pearson

doi:10.1117/12.872189

4 February 2011 Line and streak detection on polished and textured surfaces using line integrals

M. Sezer Erkilinc, Mustafa Jaber, Eli Saber, Robert Pearson

Proceedings Volume 7870, Image Processing: Algorithms and Systems IX; 787008 (2011) https://doi.org/10.1117/12.872189
Event: IS&T/SPIE Electronic Imaging, 2011, San Francisco Airport, California, United States

Abstract

In this paper, a framework for detecting lines in a polished or textured substrate is proposed. Modules for image capture, rectification, enhancement, and line detection are included. If the surface being examined is specular (mirror-like), the image capture will be restricted, that is, the camera has to be fixed off-axis in the zenith direction. A module for image rectification and projection is included to overcome this limitation in order to yield an orthographic image. In addition, a module for image enhancement that includes high-boost is employed to improve the edge sharpness and decrease the spatial noise in the image. Finally, a line-integral technique is applied to find the confidence vectors that represent the spatial positions of the lines of interest. The Full-Width at Half-Max (FWHM) approximation is applied to determine the corresponding lines in a target image. Experimental results show that our technique has an effective performance on synthetic and real images. Print quality assessment is the main application of the proposed algorithm; however, it can be used to detect lines/ streak in prints, on substrate or any type of media where lines are visible.

Citation Download Citation

M. Sezer Erkilinc, Mustafa Jaber, Eli Saber, and Robert Pearson "Line and streak detection on polished and textured surfaces using line integrals", Proc. SPIE 7870, Image Processing: Algorithms and Systems IX, 787008 (4 February 2011); https://doi.org/10.1117/12.872189

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