Paper
11 February 2011 Polarization sensitive and Mueller matrix OCT measurements and data analysis
Author Affiliations +
Abstract
The present work developed a Polarization Sensitive Optical Coherence Tomography system capable of perform birrefringence images and also determine completely the Mueller Matrix of a sample, in depth. In this way many measurements were needed to be done, with different combinations of polarization states of the incident beam on the sample and the reference arm of the interferometer. After calibrating the system, a roll of adhesive tape was used as sample for two main reasons: presents birrefringent and has a periodic structure. Firstly the system was set to gather data about the horizontal polarization state and then vertical polarization state of light to construct a birrefringence image. The birrefringence (δn) of ordinary adhesive tape was evaluated as 4.03(26)x10-4. Latter a system capable of measure any polarization state was implemented and 16 scattering profiles for different polarizations were collected. Software also was developed to solve a linear equations system. As a result a 4x4 matrix of images were calculated. Some of the features, as birefringence were easily indentified in some elements of this matrix, others, more subtle, can be founded in the literature. We also decomposed the matrix as linear combinations of other known optical elements.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcus Paulo Raele, Marcello Magri Amaral, Nilson Dias Vieira Jr., and Anderson Zanardi de Freitas "Polarization sensitive and Mueller matrix OCT measurements and data analysis", Proc. SPIE 7889, Optical Coherence Tomography and Coherence Domain Optical Methods in Biomedicine XV, 788939 (11 February 2011); https://doi.org/10.1117/12.875527
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Polarization

Optical coherence tomography

Adhesives

Software development

Birefringence

Fourier transforms

Scattering

Back to Top