Paper
23 February 2011 Toward single-material multilayer interference mid-infrared filters with sub-wavelength structures for cryogenic infrared astronomical missions
Hironobu Makitsubo, Takehiko Wada, Makoto Mita
Author Affiliations +
Proceedings Volume 7934, Optical Components and Materials VIII; 79341C (2011) https://doi.org/10.1117/12.874581
Event: SPIE OPTO, 2011, San Francisco, California, United States
Abstract
We are trying to develop high performance mid-infrared (MIR) and far-infrared (FIR) optical filters with mechanical strength and robustness for thermal cycling toward cryogenic infrared astronomical space missions. Multilayer interference filters enable us to design a wide variety of spectral response by controlling refractive index and thickness of each layer, however, in longer MIR and FIR (30-300μm) wavelength regions, there are a few optical materials known to have both good transparency and physical robustness, which makes difficult to realize high performance filters because of limited refractive index values. It is also difficult to deposit thick layers required for MIR/FIR multilayer filters by conventional method. Furthermore, multilayer interference filters are realized by thin film coatings having different coefficients of thermal expansion (CTE), which makes filters fragile for thermal cycling. To clear these problems, we introduce sub-wavelength structures (SWS) for controlling the refractive index. Then, only one material is necessary for fabricating filters, which enables us to fabricate filters with mechanical strength and robustness for thermal cycling. In 30-300μm wavelength regions silicon is very suitable for filter material because not only silicon has little absorption and physical robustness but also SWS are easily fabricated by micro-electro mechanical systems (MEMS) technology. As a first step, we have fabricated anti-reflection SWS layer on silicon wafers to demonstrate the refractive index control by simple SWS (periodic cylindrical holes on a silicon wafer). Comparing measured transmittance with both effective medium approximation (EMA) theory and rigorous coupled wave analysis (RCWA) simulation, we confirm that the refractive control of SWS layer is verified.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hironobu Makitsubo, Takehiko Wada, and Makoto Mita "Toward single-material multilayer interference mid-infrared filters with sub-wavelength structures for cryogenic infrared astronomical missions", Proc. SPIE 7934, Optical Components and Materials VIII, 79341C (23 February 2011); https://doi.org/10.1117/12.874581
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KEYWORDS
Optical filters

Silicon

Multilayer interference

Refractive index

Semiconducting wafers

Astronomy

Far infrared

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