Paper
2 February 1988 Electro-Optic Sampling: Device Embodiments And Possibilities
Gerard A. Mourou
Author Affiliations +
Proceedings Volume 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits; (1988) https://doi.org/10.1117/12.940982
Event: Advances in Semiconductors and Semiconductor Structures, 1987, Bay Point, FL, United States
Abstract
Short optical pulses have been involved in a number of areas of science and technology. It is now possible to generate optical pulses of less than 10 fs duration corresponding to only a few optical cycles. One of the most important applications of these short optical pulses is in electronics, where, in conjunction with the electro-optic effect, electrical waveforms now can be characterized with a few hundred femtosecond resolution - corresponding to 1 THz in bandwidth. This technique makes possible the characterization in situ of high-speed optoelectronic and electronic devices as well as circuits operating in the picosecond time scale or 100 GHz frequency domain.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerard A. Mourou "Electro-Optic Sampling: Device Embodiments And Possibilities", Proc. SPIE 0795, Characterization of Very High Speed Semiconductor Devices and Integrated Circuits, (2 February 1988); https://doi.org/10.1117/12.940982
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KEYWORDS
Picosecond phenomena

Electro optics

Modulators

Integrated circuits

Semiconductors

Field effect transistors

Crystals

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