Paper
26 May 2011 671-nm microsystem diode laser based on portable Raman sensor device for in-situ identification of meat spoilage
Kay Sowoidnich, Heinar Schmidt, Fredi Schwägele, Heinz-Detlef Kronfeldt
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Abstract
Based on a miniaturized optical bench with attached 671 nm microsystem diode laser we present a portable Raman system for the rapid in-situ characterization of meat spoilage. It consists of a handheld sensor head (dimensions: 210 x 240 x 60 mm3) for Raman signal excitation and collection including the Raman optical bench, a laser driver, and a battery pack. The backscattered Raman radiation from the sample is analyzed by means of a custom-designed miniature spectrometer (dimensions: 200 x 190 x 70 mm3) with a resolution of 8 cm-1 which is fiber-optically coupled to the sensor head. A netbook is used to control the detector and for data recording. Selected cuts from pork (musculus longissimus dorsi and ham) stored refrigerated at 5 °C were investigated in timedependent measurement series up to three weeks to assess the suitability of the system for the rapid detection of meat spoilage. Using a laser power of 100 mW at the sample meat spectra can be obtained with typical integration times of 5 - 10 seconds. The complex spectra were analyzed by the multivariate statistical tool PCA (principal components analysis) to determine the spectral changes occurring during the storage period. Additionally, the Raman data were correlated with reference analyses performed in parallel. In that way, a distinction between fresh and spoiled meat can be found in the time slot of 7 - 8 days after slaughter. The applicability of the system for the rapid spoilage detection of meat and other food products will be discussed.
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Kay Sowoidnich, Heinar Schmidt, Fredi Schwägele, and Heinz-Detlef Kronfeldt "671-nm microsystem diode laser based on portable Raman sensor device for in-situ identification of meat spoilage", Proc. SPIE 8024, Advanced Environmental, Chemical, and Biological Sensing Technologies VIII, 80240D (26 May 2011); https://doi.org/10.1117/12.883350
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KEYWORDS
Raman spectroscopy

Sensors

Principal component analysis

Statistical analysis

Semiconductor lasers

Head

Microsystems

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