Particle number density gradient samples for nanoparticle metrology with atomic force microscopy

Malcolm A. Lawn; Renee V. Goreham; Jan Herrmann; Asa K. Jämting

doi:10.1117/12.884566

1 June 2011 Particle number density gradient samples for nanoparticle metrology with atomic force microscopy

Malcolm A. Lawn, Renee V. Goreham, Jan Herrmann, Asa K. Jämting

Proceedings Volume 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences; 80360T (2011) https://doi.org/10.1117/12.884566
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Atomic force microscopy (AFM) can provide a link in the traceability chain between dimensional measurement techniques for nanoparticles, such as dynamic light scattering and differential centrifugal sedimentation, and the realization of the definition of the SI metre. Despite the size of nanoparticles being well within the resolution range of typical AFMs, the accurate measurement of nanoparticles with AFM presents a number of challenges. One of these challenges is the number density of particles deposited on substrates for AFM imaging and measurement. If the number density is too low, it is difficult to obtain adequate measurement statistics, whereas a number density that is too high can result in particle agglomeration on the substrate and make it difficult to image sufficient substrate area to obtain a reliable reference for height measurements. We present imaging and measurement results of 16 nm gold nanoparticles deposited on a substrate functionalized to produce a surface with a number density gradient across the sample. This substrate functionalization shows great potential for achieving reliable and efficient nanoparticle metrology with AFM.

Citation Download Citation

Malcolm A. Lawn, Renee V. Goreham, Jan Herrmann, and Asa K. Jämting "Particle number density gradient samples for nanoparticle metrology with atomic force microscopy", Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 80360T (1 June 2011); https://doi.org/10.1117/12.884566

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