Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces

J. A. Böhm; A. Vernes; G. Vorlaufer; M. J. Vellekoop

doi:10.1117/12.889488

27 May 2011 Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces

J. A. Böhm, A. Vernes, G. Vorlaufer, M. J. Vellekoop

Proceedings Volume 8082, Optical Measurement Systems for Industrial Inspection VII; 808238 (2011) https://doi.org/10.1117/12.889488
Event: SPIE Optical Metrology, 2011, Munich, Germany

Abstract

Grinding processes causes the formation of a characteristic surface structure, known as chatter marks. In this work, an angle-resolved light scattering technique is used to characterise them. In order to identify the chatter marks in a measured profile, the fast Fourier transform (FFT) is usually applied to the measured data. The FFT, however only for strictly periodic data yields unambiguous results. To overcome this, the multiresolution analysis (MRA) is also applied by means of the lifting scheme. In this manner, it is shown that chatter marks, for example, can be uniquely identified by applying the multiresolution analysis to the angle-resolved light scattering data, even when FFT fails to do this. Thus MRA alone or alternatively in combination with FFT, opens new opportunities for optical online control in case of industrial surface finishing processes.

Citation Download Citation

J. A. Böhm, A. Vernes, G. Vorlaufer, and M. J. Vellekoop "Multiresolution analysis of angle-resolved light scattering measurements on ground surfaces", Proc. SPIE 8082, Optical Measurement Systems for Industrial Inspection VII, 808238 (27 May 2011); https://doi.org/10.1117/12.889488

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