Methods for measuring work surface illuminance in adaptive solid state lighting networks

Byungkun Lee; Matthew Aldrich; Joseph A. Paradiso

doi:10.1117/12.893562

23 September 2011 Methods for measuring work surface illuminance in adaptive solid state lighting networks

Byungkun Lee, Matthew Aldrich, Joseph A. Paradiso

Proceedings Volume 8123, Eleventh International Conference on Solid State Lighting; 81230V (2011) https://doi.org/10.1117/12.893562
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

The inherent control flexibility implied by solid-state lighting - united with the rich details offered by sensor networks - prompts us to rethink lighting control. In this research, we propose several techniques for measuring work surface illuminance and ambient light using a sensor network. The primary goal of this research is to measure work surface illuminance without distraction to the user. We discuss these techniques, including the lessons learned from our prior research. We present a new method for measuring the illuminance contribution of an arbitrary luminaire at the work surface by decomposing the modulated light into its fundamental and harmonic components.

Citation Download Citation

Byungkun Lee, Matthew Aldrich, and Joseph A. Paradiso "Methods for measuring work surface illuminance in adaptive solid state lighting networks", Proc. SPIE 8123, Eleventh International Conference on Solid State Lighting, 81230V (23 September 2011); https://doi.org/10.1117/12.893562

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