Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHÉ) case

Xiaohao Dong; Thierry Moreno; Nicolas Guignot; Jean-Paul Itié

doi:10.1117/12.893643

23 September 2011 Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHÉ) case

Xiaohao Dong, Thierry Moreno, Nicolas Guignot, Jean-Paul Itié

Author Affiliations +

Proceedings Volume 8141, Advances in Computational Methods for X-Ray Optics II; 814113 (2011) https://doi.org/10.1117/12.893643
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States

Abstract

Optical design of hard x-ray beamlines can be accurately performed through ray tracing simulation technique. We describe here the way and the tools we use at SOLEIL to develop hard x-ray beamlines such as PSICHÉ, which is a wiggler beamline performing diffraction and tomography experiments from 20 to 50 keV. This beamline is made of two focusing stages, one with a long vertical focusing mirror together with a sagittal focusing crystal monochromator to gain a spot of 100x50 μm and the other one applying a set of graded multilayer KB mirrors to reach 10x10 μm spot. Ray tracing simulations are performed with SpotX, which provides optical properties of the beamline taking into account thermal load on optics, surface polishing defects from the profilometer measurements.

Citation Download Citation

Xiaohao Dong, Thierry Moreno, Nicolas Guignot, and Jean-Paul Itié "Ray tracing application in hard x-ray optical development: Soleil first wiggler beamline (PSICHÉ) case", Proc. SPIE 8141, Advances in Computational Methods for X-Ray Optics II, 814113 (23 September 2011); https://doi.org/10.1117/12.893643

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