Interferometric Testing Technology Developments And Applications In Japan

Toyohiko Yatagai

doi:10.1117/12.941756

23 March 1987 Interferometric Testing Technology Developments And Applications In Japan

Toyohiko Yatagai

Proceedings Volume 0816, Interferometric Metrology; (1987) https://doi.org/10.1117/12.941756
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

Research efforts for interferometric techniques and their applications in Japan are reviewed with an emphasis on recent developments. We will describe briefly digital fringe analysis techniques and theoretical approaches to precision phase analysis, and then practical applications of novel interferometers, holography, moire topography and optical fiber interferometry.

Citation Download Citation

Toyohiko Yatagai "Interferometric Testing Technology Developments And Applications In Japan", Proc. SPIE 0816, Interferometric Metrology, (23 March 1987); https://doi.org/10.1117/12.941756

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available