Optical, chemical, depth, and magnetic characterization of Mg/Co-based nanometric periodic multilayers

P. Jonnard; K. Le Guen; M.-H. Hu; J.-M. André; S. K. Zhou; H. Ch. Li; J. T. Zhu; Z. S. Wang; N. Mahne; A. Giglia; S. Nannarone; A. Verna; C. Meny; A. Galtayries; I. Estève; M. Walls

doi:10.1117/12.895316

4 October 2011 Optical, chemical, depth, and magnetic characterization of Mg/Co-based nanometric periodic multilayers

P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone, A. Verna, C. Meny, A. Galtayries, I. Estève, M. Walls

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Proceedings Volume 8168, Advances in Optical Thin Films IV; 816818 (2011) https://doi.org/10.1117/12.895316
Event: SPIE Optical Systems Design, 2011, Marseille, France

Abstract

We have developed and elaborated a series of Mg/Co-based periodic multilayers to build efficient mirrors for the extreme ultraviolet (EUV) range. For s-polarized light and at 45° of grazing incidence, the reflectivity of as-deposited Mg/Co is 42.6% at 25.1 nm. X-ray emission spectroscopy and nuclear magnetic resonance measurements do not indicate any noticeable interdiffusion at the interfaces between layers. Scanning transmission electronic microscopy images attest the high structural quality of the stack. X-ray reflectivity (XRR) curves in the hard x-ray and EUV domains confirm this description and estimate a weak interfacial roughness (~ 0.5 nm). Taking advantage of the magnetic character of Co, we have performed resonant magnetic reflectivity measurements by scanning the photon energy around the Co L absorption edge for opposite circular polarizations. The magnetization profile of the Co layers within Co/Mg determined with an expected depth resolution of one monolayer confirms the interface abruptness. Scanning electron microscopy images and XRR curves give evidence of the thermal stability of Mg/Co up to 300 °C. From that value, a strong change in the sample morphology due to the delamination of the multilayer from the substrate occurs. This should account for the drastic reflectivity drop observed above this temperature. Starting from Mg/Co, we have inserted a Zr layer at one or at the other interface or at both interfaces to estimate the effect of the introduction of a third material within the period. We have found that Mg/Co/Zr is more efficient (50% of reflectivity) than Mg/Zr/Co and Mg/Zr/Co/Zr (~ 40%). Through time-of-flight secondary ion mass spectrometry depth profiling and NMR measurements, we have assigned this difference to an intermixing process when Co layers are deposited onto Zr layers.

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P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, S. K. Zhou, H. Ch. Li, J. T. Zhu, Z. S. Wang, N. Mahne, A. Giglia, S. Nannarone, A. Verna, C. Meny, A. Galtayries, I. Estève, and M. Walls "Optical, chemical, depth, and magnetic characterization of Mg/Co-based nanometric periodic multilayers", Proc. SPIE 8168, Advances in Optical Thin Films IV, 816818 (4 October 2011); https://doi.org/10.1117/12.895316

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KEYWORDS

Reflectivity

Interfaces

Magnesium

Chemical species

Cobalt

Extreme ultraviolet

Zirconium

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