Paper
28 November 2011 The polishing detection method of side-polished fiber
Yaxun Zhang, Lei Wang, Zhihai Liu
Author Affiliations +
Abstract
Micro crack and pits of Side-polished fiber (SPF) is polished by fine sand paper and by an arc discharge, and their effects are compared. When there is no light through SPF after polishing, we will find that using an arc discharge method is better than fine sand paper polishing method especially their images being compared. When light passes SPF after polishing, we will find that transmitted light of SPF by using an arc discharge method is less than the others. In conclusion, using an arc discharge method is obviously better than fine sand paper polishing method.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yaxun Zhang, Lei Wang, and Zhihai Liu "The polishing detection method of side-polished fiber", Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 820211 (28 November 2011); https://doi.org/10.1117/12.906590
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Cited by 4 scholarly publications.
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KEYWORDS
Polishing

Optical fibers

Surface finishing

Fiber optics

Surface roughness

Cladding

Fiber optic communications

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