Paper
18 May 2012 Advanced trend removal in 3D noise calculation
Author Affiliations +
Abstract
While it is now common practice to use a trend removal to eliminate low frequency xed pattern noise in thermal imaging systems, there is still some disagreement as to whether one means of trend removal is better than another and whether or not the strength of the trend removal should be limited. The dierent methods for trend removal will be presented as well as an analysis of the calculated noise as a function of their strengths will be presented for various thermal imaging systems. In addition, trend removals were originally put in place in order to suppress the low-frequency component of the Sigma VH term. It is now prudent to perform a trend removal at an intermediate noise calculation step in order to suppress the low frequency component of both the Sigma V and Sigma H components. A discussion of the ramications of this change in measurement will be included for thermal modeling considerations.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephen D. Burks and Quang Nguyen "Advanced trend removal in 3D noise calculation", Proc. SPIE 8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII, 835509 (18 May 2012); https://doi.org/10.1117/12.917726
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KEYWORDS
Sensors

Image sensors

Thermal modeling

Imaging systems

3D metrology

Systems modeling

Thermography

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