Paper
17 September 2012 In-band and out-of-band reflectance calibrations of the EUV multilayer mirrors of the atmospheric imaging assembly instrument aboard the Solar Dynamics Observatory
Regina Soufli, Eberhard Spiller, David L. Windt, Jeff C. Robinson, Eric M. Gullikson, Luis Rodriguez-de Marcos, Monica Fernandez-Perea, Sherry L. Baker, Andrew L. Aquila, Franklin J. Dollar, José Antonio Méndez , Juan I. Larruquert, Leon Golub, Paul Boerner
Author Affiliations +
Abstract
Experimental multilayer reflectance data on flight mirrors and witnesses for three extreme ultraviolet (EUV) channels of the Atmospheric Imaging Assembly (AIA) instrument aboard NASA’s Solar Dynamics Observatory are presented and compared to theoretical models. The relevance of these results to the performance of the AIA instrument is discussed.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Regina Soufli, Eberhard Spiller, David L. Windt, Jeff C. Robinson, Eric M. Gullikson, Luis Rodriguez-de Marcos, Monica Fernandez-Perea, Sherry L. Baker, Andrew L. Aquila, Franklin J. Dollar, José Antonio Méndez , Juan I. Larruquert, Leon Golub, and Paul Boerner "In-band and out-of-band reflectance calibrations of the EUV multilayer mirrors of the atmospheric imaging assembly instrument aboard the Solar Dynamics Observatory", Proc. SPIE 8443, Space Telescopes and Instrumentation 2012: Ultraviolet to Gamma Ray, 84433C (17 September 2012); https://doi.org/10.1117/12.927274
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Cited by 9 scholarly publications.
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KEYWORDS
Reflectivity

Mirrors

Multilayers

Extreme ultraviolet

Statistical modeling

Calibration

Data modeling

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