Uncertainty analysis in lifetime measurement for white light emitting diodes

Haiping Shen; Xiaoli Zhou; Wanlu Zhang; Muqing Liu

doi:10.1117/12.930579

15 October 2012 Uncertainty analysis in lifetime measurement for white light emitting diodes

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, Muqing Liu

Proceedings Volume 8484, Twelfth International Conference on Solid State Lighting and Fourth International Conference on White LEDs and Solid State Lighting; 84840A (2012) https://doi.org/10.1117/12.930579
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

Lifetime is one of the most important characteristics of white LEDs for the solid state lighting industry and end users. The measurement uncertainties should be controlled well to ensure consistent measurement results. This paper gives uncertainty analysis in the measurement for the L50 lifetime of white LEDs. The exponential model is assumed for LEDs’ light output degradation, and an Eyring model is used for accelerated life test. The influences of photometric measurement instruments, measurement duration and interval, junction temperature, input current, current accelerating index and activation energy are analysed. The analysis method introduced in this paper can be referenced for other related analysis, and the results are important to the practices in LED lifetime measurement.

Citation Download Citation

Haiping Shen, Xiaoli Zhou, Wanlu Zhang, and Muqing Liu "Uncertainty analysis in lifetime measurement for white light emitting diodes", Proc. SPIE 8484, Twelfth International Conference on Solid State Lighting and Fourth International Conference on White LEDs and Solid State Lighting, 84840A (15 October 2012); https://doi.org/10.1117/12.930579

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