Paper
1 November 2012 Individual particle analysis in suburban Osaka
Makiko Nakata, Itaru Sano, Sonoyo Mukai
Author Affiliations +
Abstract
Higashi-Osaka is urban area located on the east of Osaka city in Japan. We equip various ground measurement devices in Higashi-Osaka campus of Kinki University. The data supplied by the Cimel instrument are analyzed with a standard AERONET (Aerosol Robotics Network) processing system. We set up an SPM sampler attached to our AERONET site. It is found from the simultaneous measurements and analyses that clear atmosphere with few small particles is not too often, usually polluted particles from diesel vehicles and industries are suspended at Higashi-Osaka and the characterization of atmospheric particles varies especially in dust phenomenon. Then we performed detailed analysis of atmospheric particles in dust days. We analyzed atmospheric particles with scanning electron microscope coupled with energy dispersive X-ray analyzer. This instrument can detect contain elements of sample by X-ray emanated from the surface of the sample. In order to investigate change of particle properties before and after dust event, we select three cases as before dust reaches to Higashi-Osaka, peak of dust event and after dust event and after dust passes. The results of analyses for each case indicate that nonspherical particles with large particle size are dominant and the main component becomes silicon derived from soil particles at the peak of dust event and soil particles remain after dust event. It is found that sometimes anthropogenic pollutant is transported to Higashi-Osaka before dust comes and components from anthropogenic source increase before dust event.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Makiko Nakata, Itaru Sano, and Sonoyo Mukai "Individual particle analysis in suburban Osaka", Proc. SPIE 8534, Remote Sensing of Clouds and the Atmosphere XVII; and Lidar Technologies, Techniques, and Measurements for Atmospheric Remote Sensing VIII, 85340S (1 November 2012); https://doi.org/10.1117/12.974429
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KEYWORDS
Atmospheric particles

Particles

Aerosols

Silicon

Scanning electron microscopy

Scanning probe microscopy

Soil contamination

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