Paper
26 February 2013 Advances in high power and high brightness laser bars with enhanced reliability
Haiyan An, Ching-Long (John) Jiang, Yihan Xiong, Aloysius Inyang, Qiang Zhang, Alexander Lewin, Stephan Strohmaier, Georg Treusch
Author Affiliations +
Abstract
The advances in laser-diode technology have enabled high efficiency direct diode base modules to emerge as a building block for industrial high power laser systems. Consequently, these systems have been implemented with advance robust, higher-brightness and reliable laser sources for material processing application. Here at the company, we use low-fill factor bars to build fiber-coupled and passively cooled modules, which form the foundation for “TruDiode,” the series of TRUMPF direct diode laser systems that can perform in the multi-kilowatt arena with high beam quality. However, higher reliable output power, additional efficiency and greater slow axis beam quality of the high power laser bars are necessary to further increase the brightness and reduce the cost of the systems. In order to improve the slow axis beam quality, we have optimized the bar epitaxial structures as well as the lateral design. The detailed near field and far field studies of the slow axis for each individual emitters on the bar provide us with information about the dependency of beam quality as a function of the drive current. Based on these study results for direct diode application, we have optimized the high brightness bar designs at 900-1070nm wavelengths. In addition, high power and high efficiency laser bars with high fill factors have been used to build the pump sources for thin disc laser systems at TRUMPF Photonics. For better system performances with lower costs, we have further optimized bar designs for this application. In this paper, we will give an overview of our recent advances in high power and brightness laser bars with enhanced reliability. We will exhibit beam quality study, polarization and reliability test results of our laser bars in the 900-1070nm wavelengths region for coarse wavelength multiplexing. Finally, we will also present the performance and reliability results of the 200W bar, which will be used for our next generation thin disk laser pump source.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Haiyan An, Ching-Long (John) Jiang, Yihan Xiong, Aloysius Inyang, Qiang Zhang, Alexander Lewin, Stephan Strohmaier, and Georg Treusch "Advances in high power and high brightness laser bars with enhanced reliability", Proc. SPIE 8605, High-Power Diode Laser Technology and Applications XI, 86050U (26 February 2013); https://doi.org/10.1117/12.2004979
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Cited by 5 scholarly publications.
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KEYWORDS
Reliability

Semiconductor lasers

Polarization

High power lasers

Diodes

Packaging

Laser systems engineering

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