Reflection-absorption infrared spectroscopy of thin films using an external cavity quantum cascade laser

Mark C. Phillips; Ian M. Craig; Thomas A. Blake

doi:10.1117/12.2002849

4 February 2013 Reflection-absorption infrared spectroscopy of thin films using an external cavity quantum cascade laser

Mark C. Phillips, Ian M. Craig, Thomas A. Blake

Author Affiliations +

Proceedings Volume 8631, Quantum Sensing and Nanophotonic Devices X; 86310C (2013) https://doi.org/10.1117/12.2002849
Event: SPIE OPTO, 2013, San Francisco, California, United States

Abstract

We present experimental demonstrations using a broadly tunable external cavity quantum cascade laser (ECQCL) to perform Reflection-Absorption InfraRed Spectroscopy (RAIRS) of thin layers and residues on surfaces. The ECQCL compliance voltage was used to measure fluctuations in the ECQCL output power and improve the performance of the RAIRS measurements. Absorption spectra from self-assembled monolayers of a fluorinated alkane thiol and a thiol carboxylic acid were measured and compared with FTIR measurements. RAIRS spectra of the explosive compounds PETN, RDX, and tetryl deposited on gold substrates were also measured. Rapid measurement times and low noise were demonstrated, with <1E-3 absorbance noise for a 10 second measurement time.

Citation Download Citation

Mark C. Phillips, Ian M. Craig, and Thomas A. Blake "Reflection-absorption infrared spectroscopy of thin films using an external cavity quantum cascade laser", Proc. SPIE 8631, Quantum Sensing and Nanophotonic Devices X, 86310C (4 February 2013); https://doi.org/10.1117/12.2002849

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