Hyperspectral imaging system for whole corn ear surface inspection

Haibo Yao; Russell Kincaid; Zuzana Hruska; Robert L. Brown; Deepak Bhatnagar; Thomas E. Cleveland

doi:10.1117/12.2016942

29 May 2013 Hyperspectral imaging system for whole corn ear surface inspection

Haibo Yao, Russell Kincaid, Zuzana Hruska, Robert L. Brown, Deepak Bhatnagar, Thomas E. Cleveland

Proceedings Volume 8721, Sensing for Agriculture and Food Quality and Safety V; 87210H (2013) https://doi.org/10.1117/12.2016942
Event: SPIE Defense, Security, and Sensing, 2013, Baltimore, Maryland, United States

Abstract

Aflatoxin is a mycotoxin produced mainly by Aspergillus flavus (A.flavus) and Aspergillus parasitiucus fungi that grow naturally in corn. Very serious health problems such as liver damage and lung cancer can result from exposure to high toxin levels in grain. Consequently, many countries have established strict guidelines for permissible levels in consumables. Conventional chemical-based analytical methods used to screen for aflatoxin such as thin-layer chromatography (TLC) and high performance liquid chromatography (HPLC) are time consuming, expensive, and require the destruction of samples as well as proper training for data interpretation. Thus, it has been a continuing effort within the research community to find a way to rapidly and non-destructively detect and possibly quantify aflatoxin contamination in corn. One of the more recent developments in this area is the use of spectral technology. Specifically, fluorescence hyperspectral imaging offers a potential rapid, and non-invasive method for contamination detection in corn infected with toxigenic A.flavus spores. The current hyperspectral image system is designed for scanning flat surfaces, which is suitable for imaging single or a group of corn kernels. In the case of a whole corn cob, it is preferred to be able to scan the circumference of the corn ear, appropriate for whole ear inspection. This paper discusses the development of a hyperspectral imaging system for whole corn ear imaging. The new instrument is based on a hyperspectral line scanner using a rotational stage to turn the corn ear.

Citation Download Citation

Haibo Yao, Russell Kincaid, Zuzana Hruska, Robert L. Brown, Deepak Bhatnagar, and Thomas E. Cleveland "Hyperspectral imaging system for whole corn ear surface inspection", Proc. SPIE 8721, Sensing for Agriculture and Food Quality and Safety V, 87210H (29 May 2013); https://doi.org/10.1117/12.2016942

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