Open Access Paper
31 January 2013 Front Matter: Volume 8759
Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 875901 (2013) https://doi.org/10.1117/12.2021213
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 8759, including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 8759", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 875901 (31 January 2013); https://doi.org/10.1117/12.2021213
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KEYWORDS
Defense technologies

Metrology

Lithium

Imaging systems

Error analysis

Electronics

Information technology

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