Paper
31 January 2013 Reduce impact of the Talbot effect in laser parallel confocal measurement within LED
Author Affiliations +
Proceedings Volume 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation; 87593T (2013) https://doi.org/10.1117/12.2014723
Event: International Symposium on Precision Engineering Measurement and Instrumentation 2012, 2012, Chengdu, China
Abstract
The axial resolution of parallel confocal measurement can be improved as the laser source added into the system, but extreme monochromaticity of laser beam will produce the Talbot effect, which is an effect of many images of point light array appear along the optical path direction, and it causes to distinguish the true in-focus image from lots of Talbot images difficultly, which means the confocal measurement can’t be carried on. The author researched factors of the influences for Talbot distance, and developed some methods to weaken the impact of the Talbot effect. A LED was added into the laser parallel confocal measurement system to find the in-focus image, and there were no Talbot images nearby to impede positioning, and then the laser beam was lead into the system to measure with high precision. The difference of location of the two in-focus images with laser and LED was about 11μm in the experiment, which was shorter than one Talbot distance in the system, and the result indicated that the in-focal could be distinguished with this method.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qing Yu, Ruifang Ye, and Wei Fan "Reduce impact of the Talbot effect in laser parallel confocal measurement within LED", Proc. SPIE 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation, 87593T (31 January 2013); https://doi.org/10.1117/12.2014723
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Light emitting diodes

Confocal microscopy

Precision measurement

Image processing

Laser sources

Charge-coupled devices

Light sources

RELATED CONTENT

Simulation of spectral confocal microscopy system
Proceedings of SPIE (July 26 2022)
Automatic measurement system for long term LED parameters
Proceedings of SPIE (September 11 2015)
Study on chromaticity balance for LED exposure system
Proceedings of SPIE (February 22 2008)
Measuing the steel tensile deformation based on linear CCD
Proceedings of SPIE (August 18 2011)
Color Laser Microscope
Proceedings of SPIE (April 01 1987)
Imaging modalities in confocal correlation microscopy
Proceedings of SPIE (May 06 1999)

Back to Top