Detection and localization of building insulation faults using optical-fiber DTS system

Martin Papes; Andrej Liner; Petr Koudelka; Petr Siska; Jakub Cubik; Stanislav Kepak; Jakub Jaros; Vladimir Vasinek

doi:10.1117/12.2017285

3 May 2013 Detection and localization of building insulation faults using optical-fiber DTS system

Martin Papes, Andrej Liner, Petr Koudelka, Petr Siska, Jakub Cubik, Stanislav Kepak, Jakub Jaros, Vladimir Vasinek

Proceedings Volume 8774, Optical Sensors 2013; 87741H (2013) https://doi.org/10.1117/12.2017285
Event: SPIE Optics + Optoelectronics, 2013, Prague, Czech Republic

Abstract

Nowadays the trends in the construction industry are changing at an incredible speed. The new technologies are still emerging on the market. Sphere of building insulation is not an exception as well. One of the major problems in building insulation is usually its failure, whether caused by unwanted mechanical intervention or improper installation. The localization of these faults is quite difficult, often impossible without large intervention into the construction. As a proper solution for this problem might be utilization of Optical-Fiber DTS system based on stimulated Raman scattering. Used DTS system is primary designed for continuous measurement of the temperature along the optical fiber. This system is using standard optical fiber as a sensor, which brings several advantages in its application. First, the optical fiber is relatively inexpensive, which allows to cover a quite large area for a small cost. The other main advantages of the optical fiber are electromagnetic resistance, small size, safety operation in inflammable or explosive area, easy installation, etc. This article is dealing with the detection and localization of building insulation faults using mentioned system.

Citation Download Citation

Martin Papes, Andrej Liner, Petr Koudelka, Petr Siska, Jakub Cubik, Stanislav Kepak, Jakub Jaros, and Vladimir Vasinek "Detection and localization of building insulation faults using optical-fiber DTS system", Proc. SPIE 8774, Optical Sensors 2013, 87741H (3 May 2013); https://doi.org/10.1117/12.2017285

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