Research on ESPI image enhancement technology

Di Wu; Lei Dai; Chang-song Yu

doi:10.1117/12.2031695

19 September 2013 Research on ESPI image enhancement technology

Di Wu, Lei Dai, Chang-song Yu

Proceedings Volume 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications; 890507 (2013) https://doi.org/10.1117/12.2031695
Event: ISPDI 2013 - Fifth International Symposium on Photoelectronic Detection and Imaging, 2013, Beijing, China

Abstract

Electronic Speckle Pattern Interferometry (ESPI) technology is used for non-contact measurement. However, original ESPI images are with fluent speckle noise, which leads to low ratio of signal-to-noise. Both reducing the speckle noise and preserve the fringe pattern are important in EPSI image enhancement. Nowadays the partial differential equation method is widely used for EPSI image enhancement. It has advantages that can reduce speckle noise and protect the edge of fringe pattern. By discussing the factors of this method, comparing the enhancement results, we try to give out conclusion that the best choice for EPSI image enhancement applications.

Citation Download Citation

Di Wu, Lei Dai, and Chang-song Yu "Research on ESPI image enhancement technology", Proc. SPIE 8905, International Symposium on Photoelectronic Detection and Imaging 2013: Laser Sensing and Imaging and Applications, 890507 (19 September 2013); https://doi.org/10.1117/12.2031695

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