Radar cross section measurements of frequency selective terahertz retroreflectors

Richard J. Williams; Andrew J. Gatesman; Thomas M. Goyette; Robert H. Giles

doi:10.1117/12.2051802

21 May 2014 Radar cross section measurements of frequency selective terahertz retroreflectors

Richard J. Williams, Andrew J. Gatesman, Thomas M. Goyette, Robert H. Giles

Proceedings Volume 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense; 91020R (2014) https://doi.org/10.1117/12.2051802
Event: SPIE Sensing Technology + Applications, 2014, Baltimore, MD, United States

Abstract

The radar cross section of spherical retroreflectors operating at terahertz frequencies is investigated. Several spherical retroreflectors with diameters ranging from 2 mm to 8 mm were fabricated and their radar cross section was measured at 100 GHz, 160 GHz, and 350 GHz. A frequency selective surface was applied to the retroreflectors to demonstrate proof of concept of narrow-band terahertz retroreflection.

Citation Download Citation

Richard J. Williams, Andrew J. Gatesman, Thomas M. Goyette, and Robert H. Giles "Radar cross section measurements of frequency selective terahertz retroreflectors", Proc. SPIE 9102, Terahertz Physics, Devices, and Systems VIII: Advanced Applications in Industry and Defense, 91020R (21 May 2014); https://doi.org/10.1117/12.2051802

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