Paper
28 May 2014 Study on the stitching interferometry for the surface profile measurement of a large aperture component
Author Affiliations +
Abstract
The stitching interferometry for the surface profile measurement of a large aperture component is studied. To analyze the overlapping region interferogram of the adjacent subapertures with Scale Invariant Feature Transform(SIFT) algorithm, the stitching parameters of the adjacent subapertures and then overall surface information of the tested component can be obtained. SIFT algorithm of subaperture positioning, interferogram processing, phase unwrapping, Zernike polynomials wavefront fitting and subaperture wavefront stitching programs are written. A principle experiment has been carried out. Compared with the measurement results between the stitching interferometry and full caliber testing, the deviation of RMS is less than 2nm.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Weirui Zhao, Lirong Qiu, Weiqian Zhao, and Genrui Cao "Study on the stitching interferometry for the surface profile measurement of a large aperture component", Proc. SPIE 9110, Dimensional Optical Metrology and Inspection for Practical Applications III, 91100W (28 May 2014); https://doi.org/10.1117/12.2053182
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Wavefronts

Stitching interferometry

Mirrors

Zernike polynomials

Interferometers

Phase shifting

Phase shifts

Back to Top