Testing the analytical model of the pyramid wavefront sensor with high-order aberrations on the optical bench

Matthias Rosensteiner; Jean-Pierre Véran

doi:10.1117/12.2056895

21 July 2014 Testing the analytical model of the pyramid wavefront sensor with high-order aberrations on the optical bench

Matthias Rosensteiner, Jean-Pierre Véran

Author Affiliations +

Proceedings Volume 9148, Adaptive Optics Systems IV; 914853 (2014) https://doi.org/10.1117/12.2056895
Event: SPIE Astronomical Telescopes + Instrumentation, 2014, Montréal, Quebec, Canada

Abstract

The pyramid wavefront sensor (PWFS) is generally considered a better alternative to the widely used Shack-Hartmann wavefront sensor (SHWFS), due to the theoretically higher sensibility and increased resistance to aliasing. These properties, which stem from the duality of the PWFS as a slope/phase sensor, are very desirable, since they can lead to increased performance and higher sky coverage in AO systems. We have tried to verify these properties experimentally by using a 32×32 MEMS deformable mirror to create Fourier modes, which were presented to a prototype PWFS.

Citation Download Citation

Matthias Rosensteiner and Jean-Pierre Véran "Testing the analytical model of the pyramid wavefront sensor with high-order aberrations on the optical bench", Proc. SPIE 9148, Adaptive Optics Systems IV, 914853 (21 July 2014); https://doi.org/10.1117/12.2056895

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