Developing detection efficiency standards for atom probe tomography

Ty J. Prosa; Brian P. Geiser; Dan Lawrence; David Olson; David J. Larson

doi:10.1117/12.2062211

27 August 2014 Developing detection efficiency standards for atom probe tomography

Ty J. Prosa, Brian P. Geiser, Dan Lawrence, David Olson, David J. Larson

Proceedings Volume 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII; 917307 (2014) https://doi.org/10.1117/12.2062211
Event: SPIE NanoScience + Engineering, 2014, San Diego, California, United States

Abstract

Atom Probe Tomography (APT) is a near-atomic-scale analytical technique which, due to recent advances in instrumentation and sample preparation techniques, is being used on a variety of 3D applications. Total system detection efficiency is a key parameter for obtaining accurate spatial reconstruction of atomic coordinates from detected ions, but experimental determination of efficiency can be difficult. This work explores new ways to measure total system detection efficiency as well as the specimen characteristics necessary for such measurements. Composite specimens composed of a nickel/chromium multilayer core, National Institute of Standards and Technology Standard Reference Material 2135c, encapsulated with silver, silicon, or nickel were used to demonstrate the suitability of this approach for providing a direct measurement of APT efficiency. Efficiency measurements based on this multilayer encapsulated in nickel are reported.

Citation Download Citation

Ty J. Prosa, Brian P. Geiser, Dan Lawrence, David Olson, and David J. Larson "Developing detection efficiency standards for atom probe tomography", Proc. SPIE 9173, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VIII, 917307 (27 August 2014); https://doi.org/10.1117/12.2062211

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