Paper
9 September 2014 Optical and re-emission behavior of silicone contaminants affected by UV irradiation with different wavelength ranges
Yuka Miura, Susumu Baba, Riyo Yamanaka, Osamu Numata, Eiji Miyazaki, Junichiro Ishizawa, Yugo Kimoto, Takashi Tamura
Author Affiliations +
Abstract
Molecular contamination by outgassing can degrade the performance of optical components. In orbit, spacecraft are exposed to various environments. UV is one of the most critical. It may also have the potential to cut the chains of organic molecules in contaminants due to its high energy, degrading optical properties and even re-emission behavior. In the present study, using two kinds of UV sources with different wavelength ranges, we compare the effect of UV lights irradiated on an optical surface with silicone contaminants. The irradiated samples were evaluated in terms of their optical properties and re-emission behavior, i.e. transmittance, and thermal desorption.
© (2014) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yuka Miura, Susumu Baba, Riyo Yamanaka, Osamu Numata, Eiji Miyazaki, Junichiro Ishizawa, Yugo Kimoto, and Takashi Tamura "Optical and re-emission behavior of silicone contaminants affected by UV irradiation with different wavelength ranges", Proc. SPIE 9196, Systems Contamination: Prediction, Measurement, and Control 2014, 91960H (9 September 2014); https://doi.org/10.1117/12.2061526
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Cited by 1 scholarly publication.
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KEYWORDS
Ultraviolet radiation

Silicon

Semiconducting wafers

UV optics

Contamination

Vacuum ultraviolet

Telescopic pixel displays

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