A new technique of recognition for coded targets in optical 3D measurement

Changye Guo; Xiaosheng Cheng; Haihua Cui; Ning Dai; Jinping Weng

doi:10.1117/12.2070957

13 November 2014 A new technique of recognition for coded targets in optical 3D measurement

Changye Guo, Xiaosheng Cheng, Haihua Cui, Ning Dai, Jinping Weng

Proceedings Volume 9276, Optical Metrology and Inspection for Industrial Applications III; 92761H (2014) https://doi.org/10.1117/12.2070957
Event: SPIE/COS Photonics Asia, 2014, Beijing, China

Abstract

A new technique for coded targets recognition in optical 3D-measurement application is proposed in this paper. Traditionally, point cloud registration is based on homologous features, such as the curvature, which is time-consuming and not reliable. For this, we paste some coded targets onto the surface of the object to be measured to improve the optimum target location and accurate correspondence among multi-source images. Circular coded targets are used, and an algorithm to automatically detecting them is proposed. This algorithm extracts targets with intensive bimodal histogram features from complex background, and filters noise according to their size, shape and intensity. In addition, the coded targets’ identification is conducted out by their ring codes. We affine them around the circle inversely, set foreground and background respectively as 1 and 0 to constitute a binary number, and finally shift one bit every time to calculate a decimal one of the binary number to determine a minimum decimal number as its code. In this 3Dmeasurement application, we build a mutual relationship between different viewpoints containing three or more coded targets with different codes. Experiments show that it is of efficiency to obtain global surface data of an object to be measured and is robust to the projection angles and noise.

Citation Download Citation

Changye Guo, Xiaosheng Cheng, Haihua Cui, Ning Dai, and Jinping Weng "A new technique of recognition for coded targets in optical 3D measurement", Proc. SPIE 9276, Optical Metrology and Inspection for Industrial Applications III, 92761H (13 November 2014); https://doi.org/10.1117/12.2070957

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available