Sensitivity-enhanced top-hat Z-scan by absorbing part of the incident light

Wei Wang; Jun-yi Yang; Yu Fang; Ying-lin Song

doi:10.1117/12.2073040

3 December 2014 Sensitivity-enhanced top-hat Z-scan by absorbing part of the incident light

Wei Wang, Jun-yi Yang, Yu Fang, Ying-lin Song

Proceedings Volume 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors; 92971P (2014) https://doi.org/10.1117/12.2073040
Event: International Symposium on Optoelectronic Technology and Application 2014, 2014, Beijing, China

Abstract

In this paper, we present a new technology to enhance the sensitivity by absorbing part of the light at the entry of the Z-scan system. Compared to the top-hat Z-scan, the curves of the modified top-hat Z-scan for the nonlinear refraction show higher peak-to-valley values, which mean higher sensitivity with our modified method. Nonlinear refraction of CS₂ is investigated using this technique with 19ps pulses at wavelength of 532 nm.

Citation Download Citation

Wei Wang, Jun-yi Yang, Yu Fang, and Ying-lin Song "Sensitivity-enhanced top-hat Z-scan by absorbing part of the incident light", Proc. SPIE 9297, International Symposium on Optoelectronic Technology and Application 2014: Laser and Optical Measurement Technology; and Fiber Optic Sensors, 92971P (3 December 2014); https://doi.org/10.1117/12.2073040

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available