Open Access Paper
24 April 2015 Front Matter: Volume 9355
Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9355, including the Title Page, Copyright information, Table of Contents, Authors, and Conference Committee listing.

SPIE is an international society advancing an interdisciplinary approach to the science and application of light.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

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Author(s), “Title of Paper,” in Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XV, edited by Alexander Heisterkamp, Peter R. Herman, Michel Meunier, Stefan Nolte, Proceedings of SPIE Vol. 9355 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628414455

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Paper Numbering: Proceedings of SPIE follow an e-First publication model, with papers published first online and then in print. Papers are published as they are submitted and meet publication criteria. A unique citation identifier (CID) number is assigned to each article at the time of the first publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online, print, and electronic versions of the publication. SPIE uses a six-digit CID article numbering system in which:

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

  • Alfano, Robert R., 17

  • Antonopoulos, G. C., 0E

  • Ashforth, Simon A., 08

  • Benabid, F., 0I

  • Bodley, Owen, 08

  • Booth, M. J., 14

  • Bosworth, Bryan T., 0P

  • Bragheri, Francesca, 0G, 16

  • Brow, R. K., 18

  • Chin, Sang, 0P

  • Claude, Theo, 16

  • Cristiani, I., 0G

  • Debords, B., 0I

  • Di Tano, M., 0G

  • Domke, Matthias, 11

  • Dupriez, P., 0I

  • Egorov, Andrey N., 1C

  • Fermann, M. E., 0K

  • Foster, Mark A., 0P

  • Friedel, Susanna, 10

  • Furuno, Tadahide, 0B

  • Gentemann, L., 0E

  • Georges, P., 0I

  • Gérôme, F., 0I

  • Giree, A., 0I

  • Gord, James R., 06

  • Gordienko, Alexandra V., 1C

  • Guang, Zhe, 0J

  • Guichard, F., 0I

  • Hagen, Y., 0I

  • Hagiyama, Man, 0B

  • Hanna, M., 0I

  • Hashimoto, Fumiya, 15

  • Heinemann, Dag, 09, 0E

  • Hendricks, F., 02

  • Hernandez-Rueda, J., 18

  • Hoerdt, Anton, 09

  • Hönninger, C., 0I

  • Hosokawa, Yoichiroh, 0B

  • Iino, Takanori, 0B

  • Ito, Akihiko, 0B

  • Itoh, Kazuyoshi, 15

  • Jiang, Jie, 0K

  • Kalies, Stefan, 09, 0E

  • Kim, Jin Hwan, 0T

  • Kim, Kyung-Soo, 0T

  • Kim, Soohyun, 0T

  • Krol, D. M., 18

  • Kwon, Won Sik, 0T

  • Lee, Kevin F., 0K

  • Machinet, G., 0I

  • Martìnez Vazquez, R., 0G

  • Masłowski, P., 0K

  • Matylitsky, V. V., 02

  • Mavritskii, Oleg B., 1C

  • Meyer, Heiko, 09, 0E

  • Mills, A., 0K

  • Minzioni, P., 0G

  • Mohr, C., 0K

  • Mondello, C., 0G

  • Mottay, E., 0I

  • Murua Escobar, Hugo, 09

  • Nava, G., 0G

  • Nolte, Stefan, 12, 15

  • Oh, Seung Ryeol, 0T

  • Oosterbeek, Reece, 08

  • Osellame, Roberto, 0G, 16

  • Ozeki, Yasuyuki, 15

  • Paiè, Petra, 0G, 16

  • Patel, R., 02

  • Pechenkin, Alexander A., 1C

  • Plech, A., 12

  • Pu, Yang, 17

  • Rakoski, M. S., 0E

  • Rhodes, Michelle, 0J

  • Richter, Sören, 12, 15

  • Rioux, Robert M., 06

  • Ripken, Tammo, 09, 0E

  • Roehner, Markus, 10

  • Roy, Sukesh, 06

  • Salter, P. S, 14

  • Savchenkov, Dmitriy V., 1C

  • Schomaker, Markus, 09, 0E

  • Schunemann, Peter G., 0K

  • Semenov, V., 18

  • Simpson, M. Cather, 08

  • Slipchenko, Mikhail N., 06

  • Smith, C. E., 18

  • Stolberg, Klaus, 10

  • Stroud, Jasper R., 0P

  • Sun, B., 14

  • Terakawa, Mitsuhiro, 03

  • Tran, Dung N., 0P

  • Tran, Trac D., 0P

  • Trebino, Rick, 0J

  • Troy, N., 18

  • Tünnermann, Andreas, 12, 15

  • Veglione, M., 0G

  • Wrzesinski, Paul J., 06

  • Yada, Shuhei, 03

  • Yang, T., 0G

  • Zaman, Taslima A., 06

  • Zaouter, Y., 0I

  • Zimmermann, Felix, 12, 15

Conference Committee

Symposium Chairs

  • Guido Hennig, Daetwyler Graphics AG (Switzerland)

  • Yongfeng Lu, University of Nebraska-Lincoln (United States)

Symposium Co-chairs

  • Bo Gu, Bos Photonics (United States)

  • Andreas Tünnermann, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany) and Friedrich-Schiller-Universität Jena (Germany)

Conference Chairs

  • Alexander Heisterkamp, Leibniz Universität Hannover (Germany)

  • Peter R. Herman, University of Toronto (Canada)

  • Michel Meunier, École Polytechnique de Montréal (Canada)

  • Stefan Nolte, Friedrich-Schiller-Universität Jena (Germany)

Conference Program Committee

  • Craig B. Arnold, Princeton University (United States)

  • James E. Carey III, SiOnyx Inc. (United States)

  • Xun Gu, ABB Corporate Research (Switzerland)

  • Denise M. Krol, University of California, Davis (United States)

  • Eric Mazur, Harvard University (United States)

  • Michael M. Mielke, Raydiance, Inc. (United States)

  • Eric P. Mottay, Amplitude Systèmes (France)

  • Christopher B. Schaffer, Cornell University (United States)

  • Alexander Szameit, Friedrich-Schiller-Universität Jena (Germany)

  • Alfred Vogel, Universität zu Lübeck (Germany)

  • Wataru Watanabe, Ritsumeikan University (Japan)

  • Sascha Weiler, TRUMPF Inc. (United States)

Session Chairs

  • 1 fs Laser Surgery and Bio-Micromachining

    Michel Meunier,École Polytechnique de Montréal (Canada)

  • 2 Ultrashort Laser Microsurgery: Joint Session with Conferences 9321 and 9355

    Alexander Heisterkamp, Leibniz Universität Hannover (Germany)

  • 3 Optical Perforation and Manipulation of Cells I: Joint Session with Conferences 9321 and 9355

    Alexander Heisterkamp, Leibniz Universität Hannover (Germany)

  • 4 Optical Perforation and Manipulation of Cells II: Joint Session with Conferences 9321 and 9355

    Michel Meunier, École Polytechnique de Montréal (Canada)

  • 5 Emerging Ultrafast Laser Technologies I

    Peter R. Herman, University of Toronto (Canada)

  • 6 Emerging Ultrafast Laser Technologies II

    Stefan Nolte, Friedrich-Schiller-Universität Jena (Germany)

  • 7 Emerging Ultrafast Laser Technologies III

    Eric P. Mottay, Amplitude Systèmes (France)

  • 8 Ultrafast Laser Micromachining

    Peter R. Herman, University of Toronto (Canada)

  • 9 Laser Micromachining in Bulk and Thin Film Materials: Joint Session with Conferences 9350 and 9355

    Bo Gu, Bos Photonics (United States)

  • 10 Laser Micromachining of Glass: Joint Session with Conferences 9350 and 9355

    Sami T. Hendow, Adaptive Laser Processing (United States)

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9355", Proc. SPIE 9355, Frontiers in Ultrafast Optics: Biomedical, Scientific, and Industrial Applications XV, 935501 (24 April 2015); https://doi.org/10.1117/12.2192584
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KEYWORDS
Laser applications

Laser vision correction

Laser cutting

Laser tissue interaction

Semiconductor lasers

Fiber lasers

Pulsed laser operation

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