Transferring the Rb+ hyperfine-structure stability to a Fabry-Perot resonator used as a frequency standard for astronomical spectrographs

Philipp Huke; Hanno Holzhüter; Ansgar Reiners

doi:10.1117/12.2184971

21 June 2015 Transferring the Rb+ hyperfine-structure stability to a Fabry-Perot resonator used as a frequency standard for astronomical spectrographs

Philipp Huke, Hanno Holzhüter, Ansgar Reiners

Author Affiliations +

Proceedings Volume 9526, Modeling Aspects in Optical Metrology V; 95260I (2015) https://doi.org/10.1117/12.2184971
Event: SPIE Optical Metrology, 2015, Munich, Germany

Abstract

We report on the experimental realization of locking a Fabry-Perot interferometer (FPI) onto a stabilized diode laser for the calibration of astronomical spectrographs. The external cavity diode laser (ECDL) is stabilized to the ⁸⁵Rb+ F* = 2 → F = 3 transition with a pump-probe setup. The stability of the⁸⁵Rb+ reached between optical clocks is on the order of 10^-13.¹ and can be used to reduce the linewidth / drift of the ECDL to a few kHz.² The measured linewidth of the transition is around 20 MHz due to unavoidable misalignment between pump- and probe-beam, power- and Doppler-broadening at room temperature.² The aim is to transfer this stability to a FPI that can be used as optical frequency standard: Therefore the phase of the light reflected from the FPI is observed using the Pound-Drever-Hall method. The theoretically reachable stability of a few mHz/Hz³ is limited by different noise factors. In order to identify these noise factors we a) follow the calculation of noise factors given by, ⁴ b) calculate the contribution of misalignment and insufficient mode matching by applying the generalized matrix-formalism,⁵ and c) estimate the contribution of the initial laser linewidth and the present electronic noise sources.

Citation Download Citation

Philipp Huke, Hanno Holzhüter, and Ansgar Reiners "Transferring the Rb+ hyperfine-structure stability to a Fabry-Perot resonator used as a frequency standard for astronomical spectrographs", Proc. SPIE 9526, Modeling Aspects in Optical Metrology V, 95260I (21 June 2015); https://doi.org/10.1117/12.2184971

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