Smart CMOS sensor for wideband laser threat detection

Craig R. Schwarze; Sameer Sonkusale

doi:10.1117/12.2188490

1 September 2015 Smart CMOS sensor for wideband laser threat detection

Craig R. Schwarze, Sameer Sonkusale

Proceedings Volume 9611, Imaging Spectrometry XX; 96110S (2015) https://doi.org/10.1117/12.2188490
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

The proliferation of lasers has led to their widespread use in applications ranging from short range standoff chemical detection to long range Lidar sensing and target designation operating across the UV to LWIR spectrum. Recent advances in high energy lasers have renewed the development of laser weapons systems. The ability to measure and assess laser source information is important to both identify a potential threat as well as determine safety and nominal hazard zone (NHZ). Laser detection sensors are required that provide high dynamic range, wide spectral coverage, pulsed and continuous wave detection, and large field of view. OPTRA, Inc. and Tufts have developed a custom ROIC smart pixel imaging sensor architecture and wavelength encoding optics for measurement of source wavelength, pulse length, pulse repetition frequency (PRF), irradiance, and angle of arrival. The smart architecture provides dual linear and logarithmic operating modes to provide 8+ orders of signal dynamic range and nanosecond pulse measurement capability that can be hybridized with the appropriate detector array to provide UV through LWIR laser sensing. Recent advances in sputtering techniques provide the capability for post-processing CMOS dies from the foundry and patterning PbS and PbSe photoconductors directly on the chip to create a single monolithic sensor array architecture for measuring sources operating from 0.26 – 5.0 microns, 1 mW/cm² – 2 kW/cm².

Citation Download Citation

Craig R. Schwarze and Sameer Sonkusale "Smart CMOS sensor for wideband laser threat detection", Proc. SPIE 9611, Imaging Spectrometry XX, 96110S (1 September 2015); https://doi.org/10.1117/12.2188490

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KEYWORDS

CMOS sensors

Sensors

Digital signal processing

Pulsed laser operation

Laser damage threshold

Readout integrated circuits

Diffraction

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