Presentation
27 April 2016 Line-scan focal modulation microscopy: a comparison study (Conference Presentation)
Nanguang Chen, Shilpa Pant
Author Affiliations +
Abstract
Focal Modulation microscopy (FMM) is a novel imaging technique offering enhanced optical sectioning. FMM introduces spatiotemporal phase modulation in the illumination beam, resulting in intensity modulated excitation and emission light. As the background fluorescence excited by scattered photons are stationary, it is possible to differentiate it from the signal. Currently we are exploring a high-speed implementation of FMM. We have developed line scan focal modulated microscopy, which features parallel illumination and parallel detection. An imaging speed of 100 frames per second achieved with such a prototype. We have conducted a series of experiments to compare the performances of line-scan FMM, line-scan confocal microscopy, and point-scanning confocal microscopy. It is evident that line-scan FMM provides the best solution for a combination of high-speed, high contrast, and high spatial resolution.
Conference Presentation
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Nanguang Chen and Shilpa Pant "Line-scan focal modulation microscopy: a comparison study (Conference Presentation)", Proc. SPIE 9713, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, 971308 (27 April 2016); https://doi.org/10.1117/12.2212710
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CITATIONS
Cited by 1 scholarly publication.
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KEYWORDS
Line scan image sensors

Modulation

Microscopy

Confocal microscopy

Luminescence

Phase modulation

Photons

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