Methods of generating a hollow spot for STED microscopy

Yun Xiao; Yunhai Zhang; Haomin Yang; Xin Zhang

doi:10.1117/12.2216429

5 November 2015 Methods of generating a hollow spot for STED microscopy

Yun Xiao, Yunhai Zhang, Haomin Yang, Xin Zhang

Proceedings Volume 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015; 97951Z (2015) https://doi.org/10.1117/12.2216429
Event: Selected Proceedings of the Photoelectronic Technology Committee Conferences held June-July 2015, 2015, Hefei, Suzhou, and Harbin, China

Abstract

On the base of the vectorial diffraction theory, the diffraction integral represents are obtained to generate a hollow spot for STED. In the paper, the incident light is modulated by phase and polarization to focus a hollow spot. The 2-dimension hollow spot is obtained by modulating the circularly polarized beam with 0-2π vortex phase or 0/π circular phase. Addition In addition, we get the 2-dimension hollow spot by focusing azimuthally polarized beam or a radially polarized beam modulated with 0/π circular phase. The intensity distributions and size of these 2-dimension hollow spots are discussed. Then the 3-dimension hollow spot is got by taking advantage of two kinds of 2-dimension hollow spots. There are two methods to generate a hollow spot by the diffraction integral represents. One is modulating two circularly polarized beams with 0-2π vortex phase and 0/π circular phase respectively. The other is choosing an azimuthally polarized beam and a radially polarized beam modulated with 0/π circular phase as depletion beams. So we obtain a 2-dimension hollow spot by modulating a beam, and obtain a 3-dimension hollow spot by modulating two beams. These hollow spots can be useful for STED to realize 2-dimension and 3-dimension super-resolution.

Citation Download Citation

Yun Xiao, Yunhai Zhang, Haomin Yang, and Xin Zhang "Methods of generating a hollow spot for STED microscopy", Proc. SPIE 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015, 97951Z (5 November 2015); https://doi.org/10.1117/12.2216429

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