Paper
20 May 2016 Formation mechanism of the photomask blanks material related haze
Jung-Jin Kim, Junyoul Choi, Soowan Koh, Minho Kim, Jiyoung Lee, Han-Shin Lee, Byung Gook Kim, Chan-uk Jeon
Author Affiliations +
Abstract
We have observed a new type haze of which formation deviates from the generally accepted models with respect to the size, shape, and removability by chemicals. It has very small size of 50~100nm and are crowded around the cell boundary, while the typical haze doesn’t prefer a special region on mask in the majority of cases. It is hard to remove by general cleaning, while the typical haze is easily removed by general cleaning process and even de-ionized water. It is confirmed that the source of the haze is blank material related ions which are formed by chemical etching of blanks during mask cleaning process or the photomask blanks itself.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jung-Jin Kim, Junyoul Choi, Soowan Koh, Minho Kim, Jiyoung Lee, Han-Shin Lee, Byung Gook Kim, and Chan-uk Jeon "Formation mechanism of the photomask blanks material related haze", Proc. SPIE 9984, Photomask Japan 2016: XXIII Symposium on Photomask and Next-Generation Lithography Mask Technology, 99840W (20 May 2016); https://doi.org/10.1117/12.2246678
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Air contamination

Photomasks

Molybdenum

Ions

Silicon

Transmission electron microscopy

Critical dimension metrology

RELATED CONTENT

The recovering method of etch chamber condition by using the...
Proceedings of SPIE (September 09 2013)
Introducing the EUV CNT pellicle
Proceedings of SPIE (October 25 2016)
The surface treatment for prevention of growing defect
Proceedings of SPIE (November 05 2005)
A new absorbing stack for EUV masks
Proceedings of SPIE (December 06 2004)
Advances in low-defect multilayers for EUVL mask blanks
Proceedings of SPIE (July 01 2002)

Back to Top