Single-shot measurement of surface topography exploiting spectral multiplexed Kramers-Kronig holographic imaging

Chungha Lee; YoonSeok Baek; YongKeun Park

doi:10.1117/12.2609619

2 March 2022 Single-shot measurement of surface topography exploiting spectral multiplexed Kramers-Kronig holographic imaging

Chungha Lee, YoonSeok Baek, YongKeun Park

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Proceedings Volume PC11970, Quantitative Phase Imaging VIII; PC119700T (2022) https://doi.org/10.1117/12.2609619
Event: SPIE BiOS, 2022, San Francisco, California, United States

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Chungha Lee, YoonSeok Baek, and YongKeun Park "Single-shot measurement of surface topography exploiting spectral multiplexed Kramers-Kronig holographic imaging", Proc. SPIE PC11970, Quantitative Phase Imaging VIII, PC119700T (2 March 2022); https://doi.org/10.1117/12.2609619

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