Phase-resolved, wide-field sum-frequency generation microscopy

Ben John; Tuhin Khan; Richarda Niemann; Alexander Paarmann; Martin Wolf; Martin Thämer

doi:10.1117/12.2633395

3 October 2022 Phase-resolved, wide-field sum-frequency generation microscopy

Ben John, Tuhin Khan, Richarda Niemann, Alexander Paarmann, Martin Wolf, Martin Thämer

Proceedings Volume PC12228, Ultrafast Nonlinear Imaging and Spectroscopy X; PC122280C (2022) https://doi.org/10.1117/12.2633395
Event: SPIE Optical Engineering + Applications, 2022, San Diego, California, United States

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Ben John, Tuhin Khan, Richarda Niemann, Alexander Paarmann, Martin Wolf, and Martin Thämer "Phase-resolved, wide-field sum-frequency generation microscopy", Proc. SPIE PC12228, Ultrafast Nonlinear Imaging and Spectroscopy X, PC122280C (3 October 2022); https://doi.org/10.1117/12.2633395

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