Optical contrast analysis of α-RuCl3 nanoflakes on oxidized silicon wafers

Tatyana V. Ivanova; Daniel Andres-Penares; Yiping Wang; Jiaqiang Yan; Kenneth S. Burch; Brian D. Gerardot; Mauro Brotons-Gisbert

doi:10.1117/12.2675491

5 October 2023 Optical contrast analysis of α-RuCl₃ nanoflakes on oxidized silicon wafers

Tatyana V. Ivanova, Daniel Andres-Penares, Yiping Wang, Jiaqiang Yan, Kenneth S. Burch, Brian D. Gerardot, Mauro Brotons-Gisbert

Author Affiliations +

Proceedings Volume PC12651, Low-Dimensional Materials and Devices 2023; PC126510R (2023) https://doi.org/10.1117/12.2675491
Event: SPIE Nanoscience + Engineering, 2023, San Diego, California, United States

Abstract

In this work, we perform spectroscopic ellipsometry measurements at room temperature on mechanically exfoliated α-RuCl3 nanoflakes of different thickness for photon wavelengths ranging between 400 and 1000 nm. Our measurements allow us to estimate the wavelength-dependent complex refractive index along the crystal directions parallel and perpendicular to the layers, which reveal an anisotropy between the in-plane and out-of-plane optical properties of the material. Our results provide a valuable information about the optical properties of 2D α-RuCl3 flakes in the visible and near infrared, which are crucial to exploit this material in nanodevices with enhanced light-matter interactions.

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Tatyana V. Ivanova, Daniel Andres-Penares, Yiping Wang, Jiaqiang Yan, Kenneth S. Burch, Brian D. Gerardot, and Mauro Brotons-Gisbert "Optical contrast analysis of α-RuCl₃ nanoflakes on oxidized silicon wafers", Proc. SPIE PC12651, Low-Dimensional Materials and Devices 2023, PC126510R (5 October 2023); https://doi.org/10.1117/12.2675491

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